Generalized shock models based on a cluster point process
Bai, JM(白建明); Li, ZH; Kong, XB; Bai, HM (reprint author), Lanzhou Univ, Sch Management, Lanzhou 730000, Peoples R China.
Indexed BySCIE ; EI
2006-08
Source PublicationIEEE TRANSACTIONS ON RELIABILITY
Volume55Issue:3Pages:542-550
PublisherIEEE
Publication PlacePISCATAWAY
AbstractWe review the principal progress of shock models during the last three decades. Our new model, the delta-shock model, and its latest developments are also introduced. Furthermore, for adapting shock models to a wider reliability field, we put forward a generalized framework for studying shock models, based on cluster point processes with cluster marks. In addition, we provide a noteworthy case under this framework as a concrete example in reliability with an insurance background, and give the asymptotic distribution of the risk process.
Keywordasymptotic distribution cluster point process with cluster marks cumulative shock model extreme shock model risk process delta-shock model
DepartmentLanzhou Univ, Sch Management, Lanzhou 730000, Peoples R China;
Lanzhou Univ, Sch Math & Stat, Lanzhou 730000, Peoples R China
Subject AreaComputer Science ; Engineering
DOI10.1109/TR.2006.879661
ISSN0018-9529
SubtypeArticle
Language英语
WOS IDWOS:000240324800017
EI ID20071510547566
First Inst
Citation statistics
Cited Times:7[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.lzu.edu.cn/handle/262010/102978
Collection管理学院_工商管理&公共管理&信息管理
Corresponding AuthorBai, HM (reprint author), Lanzhou Univ, Sch Management, Lanzhou 730000, Peoples R China.
Recommended Citation
GB/T 7714
Bai, HM,Li, ZH,Kong, XB,et al. Generalized shock models based on a cluster point process[J]. IEEE TRANSACTIONS ON RELIABILITY,2006,55(3):542-550.
APA Bai, HM,Li, ZH,Kong, XB,&Bai, HM .(2006).Generalized shock models based on a cluster point process.IEEE TRANSACTIONS ON RELIABILITY,55(3),542-550.
MLA Bai, HM,et al."Generalized shock models based on a cluster point process".IEEE TRANSACTIONS ON RELIABILITY 55.3(2006):542-550.
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