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兰州大学机构库  > 物理科学与技术学院  > 期刊论文
题名: ITO/Rubrene 表面及界面的AFM 和XPS 研究
其他题名: Surface and interface analysis of ITO/Rubrene using AFM and XPS
作者: 王金顺; 李海蓉; 彭应全; 向东旭
收录类别: EI ; CSCD
出版日期: 2014-02-15
刊名: 发光学报/Faguang Xuebao/Chinese Journal of Luminescence
卷号: 35, 期号:2, 页码:209-212
中文摘要: 采用原子力显微镜(AFM)和X射线光电子能谱仪(XPS)研究了氧化铟锡(ITO)/红荧烯(Rubrene)的形貌和表面、界面的电子态。AFM结果显示,ITO上的Rubrene膜有良好的均匀性。XPS结果表明:C1s谱有3个峰,位于282.50,284.70,289.30 eV,对应于C—Si、CO和C—C键。用氩离子束溅射表面,芳香碳对应的峰值逐渐增大,其他两个峰值迅速消失。随着表面O污染的去除,O1s峰先快速减弱然后逐渐增强。界面附近的O原子与C原子结合构成OC、C—O—C和醛基。In3d和Sn3d峰则缓慢增强,在界面附近峰值变得稳定。C1s、In3d、Sn3d谱峰都向低束缚能发生化学位...
英文摘要: The surface morphology and the interface electronic states of Indium-tin-oxide (ITO)/Rubrene were investigated by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). The AFM results manifest that the Rubrene film deposited on ITO is very uniformity. The XPS results show that there are three main peaks in the C1s spectrum of the origin surface, which located at 282.50, 284.70, 289.30 eV, respectively. They are associated with C-Si, CO, C-C bonds. With the increasing of sputtering time, the peak corresponding to the aromatic C becomes intensely while the other peaks disappear rapidly. As the removing of the oxygen contamination on the surface, the O1s peak weakens firstly and then strengthens gradually. The O atoms mainly bond to C, and form OC, C-O-C and aldehyde group in the interface. The peaks of In3d and Sn3d strengthen slowly, and become stable near the interface of ITO/Rubrene. The peak of C1s, In3d and Sn3d moves toward lower binding energy, indicating an inter-diffusion system formed by the interaction of Rubrene film and ITO in the interface.
关键词: XPS ; Rubrene ; 化学位移 ; 界面态 ; C-C bonds ; Indium tin oxide ; Interface electronics ; Interfacial state ; Oxygen contamination ; Rubrenes ; Sputtering time ; Surface and interface analysis
作者部门: 兰州大学物理科学与技术学院微电子研究所 ; 兰州大学物理科学与技术学院磁学重点实验室
通讯作者: Li, H.-R. (hrli@lzu.edu.cn)
学科分类: Materials Science; High Energy Physics; Nuclear Physics; Plasma Physics; Inorganic Compounds; Physical Chemistry; Chemistry; Optical Devices and Systems; Electromagnetic Waves
所属项目编号: 兰州市科技计划(2010-1-1) ; 兰州市城关区科技计划(2011-5-2) ; 信息功能材料国家重点实验室开放课题(12-668)资助项目
所属项目名称: 兰州市科技局资助项目
项目资助者: LZSTB
语种: 中文
DOI: 10.3788/fgxb20143502.0207
ISSN号: 10007032
CSCD记录号: CSCD:5044154
EI记录号: 20141017430438
IR记录号: CNKI:0003952
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内容类型: 期刊论文
URI标识: http://ir.lzu.edu.cn/handle/262010/107584
Appears in Collections:物理科学与技术学院_期刊论文

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Recommended Citation:
王金顺,李海蓉,彭应全,等. ITO/Rubrene 表面及界面的AFM 和XPS 研究[J]. 发光学报/Faguang Xuebao/Chinese Journal of Luminescence,2014,35(2):209-212.
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