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Determination of band alignment in two-dimensional h-BN/WS2 van der waals heterojunction by X-ray photoelectron spectroscopy
Xing, Shu'an1; Zhao, Guijuan1; Xu, Yan1; Wang, J(王杰)1; Li, Xunshuan1,2; Yang, Wenge1; Liu, GP(刘贵鹏)1,2; Yang, JH(杨建红)1
2021-02-15
Source PublicationJournal of Alloys and Compounds
ISSN09258388
Volume854
AbstractWe have fabricated two-dimensional h-BN/WS2 van der Waals heterojunctions by stacking h-BN and WS2 monolayers, and experimentally measured the valence band offset (VBO) of h-BN/WS2 heterojunction by X-ray photoelectron spectroscopy (XPS). The h-BN and WS2 monolayers band gaps and the measured value of VBO were used to determine the conduction band offset (CBO). The measurement results of VBO and CBO are 3.39 ± 0.15 eV and 0.57 ± 0.15 eV, respectively, revealing a type-I band alignment. It is urgent to measure the band alignment parameters of h-BN/WS2 heterojunctions for analyzing and designing h-BN/WS2 based devices. © 2020 Elsevier B.V.
KeywordAlignment Energy gap Heterojunctions Monolayers Photoelectrons Photons Tungsten compounds Van der Waals forces X ray photoelectron spectroscopyBand alignments Conduction band offset Measured values Type i band alignments Valence band offsets Van der waals
PublisherElsevier Ltd
DOI10.1016/j.jallcom.2020.157301
Indexed ByEI
Language英语
EI Accession Number20204009265410
EI KeywordsBoron nitride
EI Classification Number601.1 Mechanical Devices ; 714.2 Semiconductor Devices and Integrated Circuits ; 804.2 Inorganic Compounds ; 931.3 Atomic and Molecular Physics
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Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.lzu.edu.cn/handle/262010/440598
Collection资源环境学院
物理科学与技术学院
Corresponding AuthorZhao, Guijuan
Affiliation1.School of Physical Science and Technology, Lanzhou University, Lanzhou; Gansu; 730000, China;
2.Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou; Gansu; 730000, China
First Author AffilicationLanzhou University
Corresponding Author AffilicationLanzhou University
Recommended Citation
GB/T 7714
Xing, Shu'an,Zhao, Guijuan,Xu, Yan,et al. Determination of band alignment in two-dimensional h-BN/WS2 van der waals heterojunction by X-ray photoelectron spectroscopy[J]. Journal of Alloys and Compounds,2021,854.
APA Xing, Shu'an.,Zhao, Guijuan.,Xu, Yan.,Wang, Jie.,Li, Xunshuan.,...&Yang, Jianhong.(2021).Determination of band alignment in two-dimensional h-BN/WS2 van der waals heterojunction by X-ray photoelectron spectroscopy.Journal of Alloys and Compounds,854.
MLA Xing, Shu'an,et al."Determination of band alignment in two-dimensional h-BN/WS2 van der waals heterojunction by X-ray photoelectron spectroscopy".Journal of Alloys and Compounds 854(2021).
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