兰州大学机构库

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FinFET器件单粒子闩锁及翻转效应的TCAD仿真研究 学位论文
理学博士, 兰州: 兰州大学, 2021
Authors:  李东青
Favorite  |    Submit date:2023/11/15
FinFET  FinFET  单粒子闩锁  Single-event latch-up  单粒子翻转  Single-event upset  TCAD仿真  TCAD simulation  
纳米硅提升太阳能电池效率的理论及实验研究 学位论文
理学硕士, 兰州: 兰州大学, 2023
Authors:  李昂
Favorite  |    Submit date:2023/11/15
纳米硅颗粒  Silicon nanoparticles  纳米硅薄膜  Silicon nanofilms  太阳能电池  Solar cells  抗反射  Reflection reduction  有效介质理论  Effective medium theory, Transfer matrix method  传递矩阵法  Silvaco TCAD simulations  Silvaco TCAD模拟  Down-conversion effect  下转换作用  
中子辐照碲锌镉探测器损伤效应研究 学位论文
理学硕士, 兰州: 兰州大学, 2023
Authors:  魏雯静
Favorite  |    Submit date:2023/11/15
中子辐照损伤  Neutronirradiation damage  碲锌镉  CdZnTe  Geant4模拟  Geant4 simulation  TCAD模拟  TCADsimulation  
隧道场效应晶体管低温特性仿真研究 学位论文
工学学士, 兰州: 兰州大学, 2022
Authors:  沈聪
Favorite  |    Submit date:2023/03/13
低温  TFET  TCAD  仿真收敛性  
An investigation of FinFET single-event latch-up characteristic and mitigation method 期刊论文
Microelectronics Reliability, 2020, 卷号: 114
Authors:  Li, Dongqing;  Liu, Tianqi;  Wu, Zhenyu;  Cai, Chang;  Zhao, Peixiong;  He, Ze;  Liu, Jie
Favorite  |    Submit date:2020/12/16
Electric rectifiers  Electronic design automationEpitaxial substrates  Holding voltage  Horizontal resistance  Mitigation methods  Protective measures  Shallow trench isolation  Single event latch-up  TCAD simulation  
Theoretical simulation and experimental perspective of refractive index-controlled silicon nanofilms for solar cell efficiency improvement 期刊论文
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2023, 卷号: 251
Authors:  Li, Ang;  Wu, Zhiguo;  Zhuo, Renfu;  He, Tiaoe;  Zhao, Yi;  Yan, Pengxun;  Zhang, Guangan
Favorite  |    Submit date:2023/02/22
Solar cell  Silicon nanofilm  Effective dielectric functions  Refractive index  Transfer matrix method  Silvaco TCAD  
Strategy to mitigate single event upset in 14-nm CMOS bulk FinFET technology 期刊论文
Chinese Physics B, 2022, 卷号: 31, 期号: 5
Authors:  Li, Dong-Qing;  Liu, Tian-Qi;  Zhao, Pei-Xiong;  Wu, Zhen-Yu;  Wang, Tie-Shan;  Liu, Jie
Favorite  |    Submit date:2022/07/01
TCAD simulation  FinFET  single event upset (SEU) mitigation  CMOS integrated circuits  Electronic design automation  High electron mobility transistors  Ion bombardment  Radiation hardening  Taps  Transients  Bulk FinFET  Complementary metal oxide semiconductors  Metal-oxide-semiconductor transistor  N-channel  P channels  Simulation demonstrate  Single event upset mitigation  Single event upsets  Transistor channels  
SiC双沟槽MOSFET器件的单粒子效应模拟研究 学位论文
工程硕士, 兰州: 兰州大学, 2023
Authors:  彭锦秋
Favorite  |    Submit date:2023/11/15
SiC DT-MOSFET器件  SiC DT-MOSFET Devices  单粒子效应(SEE)  Single Event Effect (SEE)  单粒子烧毁(SEB)  Single Event Burnout (SEB)  单粒子栅击穿(SEGR)  Single Event Gate Rupture (SEGR)  重离子辐照损伤  Heavy Ion Irradiation Damage  中子辐照损伤  Neutron Irradiaion Damage   
Investigation of flux dependent sensitivity on single event effect in memory devices 期刊论文
Chinese Physics B, 2018, 卷号: 27, 期号: 7
Authors:  Luo, Jie;  Wang, TS(王铁山);  Li, Dong-qing;  Liu, Tian-qi;  Hou, Ming-dong;  Sun, You-mei;  Duan, Jing-lai;  Yao, Hui-jun;  Xi, Kai;  Ye, Bing...Luo, Jie;  Wang, TS(王铁山);  Li, Dong-qing;  Liu, Tian-qi;  Hou, Ming-dong;  Sun, You-mei;  Duan, Jing-lai;  Yao, Hui-jun;  Xi, Kai;  Ye, Bing;  Liu, Jie
Favorite  |    Submit date:2019/11/04
ion flux  single event effect  GEANT4 simulation  memory device  
增强型氮化镓器件特性表征和建模 学位论文
学士, 兰州: 兰州大学, 2018
Authors:  张斌
Favorite  |    Submit date:2019/01/18
GaN  增强型器件  源漏穿通  仿真