兰州大学机构库

Browse/Search Results:  1-5 of 5 Help

Selected(0)Clear Items/Page:    Sort:
Investigation of irradiation defects and hardening of cold-worked vanadium alloys 期刊论文
FUSION ENGINEERING AND DESIGN, 2023, 卷号: 189
Authors:  Han, Xuxiao;  Niu, Mengke;  Yang, Yitao;  Li, Zengde;  Wang, Tieshan;  Zhang, Chonghong
Favorite  |    Submit date:2023/05/25
Dislocation loops  DBH model  Tangled dislocations  Strength factor  Dislocation length  
Investigation of irradiation defects and hardening of cold-worked vanadium alloys 期刊论文
FUSION ENGINEERING AND DESIGN, 2023, 卷号: 189
Authors:  Han, Xuxiao;  Niu, Mengke;  Yang, Yitao;  Li, Zengde;  Wang, TS(王铁山);  Zhang, Chonghong
Favorite  |    Submit date:2023/04/12
Defects  Hardening  Irradiation  Ternary alloys  Titanium alloys  Vanadium alloys  Cold worked  Dislocation length  Dislocation loop  Dispersion barrier hardening model model  Hardening model  Irradiation defect  Irradiation hardening  Number density  Strength factor  Tangled dislocation  
Investigation of irradiation defects and hardening of cold-worked vanadium alloys 期刊论文
FUSION ENGINEERING AND DESIGN, 2023, 卷号: 189
Authors:  Han, Xuxiao;  Niu, Mengke;  Yang, Yitao;  Li, Zengde;  Wang, TS(王铁山);  Zhang, Chonghong
Favorite  |    Submit date:2023/07/18
Defects  Hardening  Irradiation  Ternary alloys  Titanium alloys  Vanadium alloys  Cold worked  Dislocation length  Dislocation loop  Dispersion barrier hardening model model  Hardening model  Irradiation defect  Irradiation hardening  Number density  Strength factor  Tangled dislocation  
Investigation of Exfoliation Efficiency of 6H-SiC Implanted Sequentially with He+ and H-2(+) Ions 期刊论文
MATERIALS, 2022, 卷号: 15, 期号: 8
Authors:  You, Guoqiang;  Lin, Haipeng;  Qu, Yanfeng;  Hao, Jie;  You, Suyuan;  Li, Bingsheng
Favorite  |    Submit date:2022/07/01
silicon carbide  H-2(+) implantation  He+ implantation  bubbles  microstructure  
Investigation of Exfoliation Efficiency of 6H-SiC Implanted Sequentially with He+ and H2+ Ions 期刊论文
Materials, 2022, 卷号: 15, 期号: 8
Authors:  You, Guoqiang;  Lin, Haipeng;  Qu, Yanfeng;  Hao, Jie;  You, Suyuan;  Li, Bingsheng
Favorite  |    Submit date:2022/07/01
Efficiency  Fracture toughness  Helium  High resolution transmission electron microscopy  Ions  Single crystals  Stacking faults  Strain  Wide band gap semiconductors  6H-Silicon carbides  Bubble  Co-implantation  Dual-beam  Fluences  Good methods  H+ implantation  H2 + implantation  He implantation  Lattice disorders