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The same band alignment of two hybrid 2D/3D vertical heterojunctions formed by combining monolayer MoS2 with semi-polar (11-22) GaN and c-plane (0001) GaN
期刊论文
APPLIED SURFACE SCIENCE, 2022
Xing, Shuan
;
Zhao, Guijuan
;
Mao, Bangyao
;
Huang, Heyuan
;
Wang, Lianshan
;
Li, Xunshuan
;
Yang, Wenge
;
Liu, Guipeng
;
Yang, Jianhong
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Submit date:2022/07/30
The same band alignment of two hybrid 2D/3D vertical heterojunctions formed by combining monolayer MoS2 with semi-polar (11-22) GaN and c-plane (0001) GaN
期刊论文
APPLIED SURFACE SCIENCE, 2022, 卷号: 599
Authors:
Xing, Shuan
;
Zhao, GJ(赵桂娟)
;
Mao, Bangyao
;
Huang, Heyuan
;
Wang, Lianshan
;
Li, XS(李训栓)
;
Yang, WG(杨文革)
;
Liu, GP(刘贵鹏)
;
Yang, JH(杨建红)
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Submit date:2022/07/25
Semi-polar GaN
c-plane GaN
Molybdenum disulfide
2D
3D heterojunctions
Band alignment
XPS
Determination of band alignment in two-dimensional h-BN/WS2 van der waals heterojunction by X-ray photoelectron spectroscopy
期刊论文
Journal of Alloys and Compounds, 2021, 卷号: 854
Authors:
Xing, Shu'an
;
Zhao, Guijuan
;
Xu, Yan
;
Wang, J(王杰)
;
Li, XS(李训栓)
;
Yang, Wenge
;
Liu, GP(刘贵鹏)
;
Yang, JH(杨建红)
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Submit date:2020/12/16
Alignment
Energy gap
Heterojunctions
Monolayers
Photoelectrons
Photons
Tungsten compounds
Van der Waals forces
X ray photoelectron spectroscopyBand alignments
Conduction band offset
Measured values
Type i band alignments
Valence band offsets
Van der waals
Analysis of dark current dependent upon threading dislocations in Ge/Si heterojunction photodetectors
期刊论文
MICROELECTRONICS INTERNATIONAL, 2012, 卷号: 29, 期号: 3, 页码: 136-140
Authors:
Wei, Y
;
Cai, XY
;
Ran, JZ(冉金枝)
;
Yang, JH(杨建红)
;
Yang, JH (reprint author), Lanzhou Univ, Inst Microelect, Sch Phys Sci & Technol, Lanzhou 730000, Peoples R China.
Adobe PDF(251Kb)
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Submit date:2015/05/25
Electric current
Sensors
Ge/Si heterojunction photodetectors
Threading dislocation
Dark current
High-precision measurement of the proton elastic form factor ratio mu(p)G(E)/G(M) at low Q(2)
期刊论文
PHYSICS LETTERS B, 2011, 卷号: 705, 期号: 1-2, 页码: 59-64
Authors:
Zhan, X
;
Allada, K
;
Armstrong, DS
;
Arrington, J
;
Bertozzi, W
;
Boeglin, W
;
Chen, JP
;
Chirapatpimol, K
;
Choi, S
;
Chudakov, E
...
Zhan, X
;
Allada, K
;
Armstrong, DS
;
Arrington, J
;
Bertozzi, W
;
Boeglin, W
;
Chen, JP
;
Chirapatpimol, K
;
Choi, S
;
Chudakov, E
;
Cisbani, E
;
Decowski, P
;
Dutta, C
;
Frullani, S
;
Fuchey, E
;
Garibaldi, F
;
Gilad, S
;
Gilman, R
;
Glister, J
;
Hafidi, K
;
Hahn, B
;
Hansen, JO
;
Higinbotham, DW
;
Holmstrom, T
;
Holt, RJ
;
Huang, J
;
Huber, GM
;
Itard, F
;
de Jager, CW
;
Jiang, X
;
Johnson, M
;
Katich, J
;
de Leo, R
;
LeRose, JJ
;
Lindgren, R
;
Long, E
;
Margaziotis, DJ
;
Beck, SMT
;
Meekins, D
;
Michaels, R
;
Moffit, B
;
Norum, BE
;
Olson, M
;
Piasetzky, E
;
Pomerantz, I
;
Protopopescu, D
;
Qian, X
;
Qiang, Y
;
Rakhman, A
;
Ransome, RD
;
Reimer, PE
;
Reinhold, J
;
Riordan, S
;
Ron, G
;
Saha, A
;
Sarty, AJ
;
Sawatzky, B
;
Schulte, EC
;
Shabestari, M
;
Shahinyan, A
;
Shneor, R
;
Sirca, S
;
Solvignon, P
;
Sparveris, NF
;
Strauch, S
;
Subedi, R
;
Sulkosky, V
;
Vilardi, I
;
Wang, Y
;
Wojtsekhowski, B
;
Ye, Z
;
Zhang, Y
;
Arrington, J (reprint author), Argonne Natl Lab, Div Phys, Argonne, IL 60439 USA.
Adobe PDF(235Kb)
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Submit date:2015/12/15
Tb 掺杂ZnO 薄膜和高K 栅介质 Er2O3薄膜的制
学位论文
博士, 兰州: 兰州大学, 2006
Authors:
方泽波
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Submit date:2019/01/18
Tb
ZnO
Er2O3